Laser diffraction

Dynamic Light Scattering

Microscopy and digital image analysis

Scanning electron microscopy / EDX

Gasadsorption (BET)

Differential Scanning Calorimetry

Air permeability

Helium pycnometry

Mercury porosimetry

Apparent volume

Flowability

Rotary sample divider

Instrument
Leica Stereoscan 360 with EDX (Energy Dispersive X-Ray Spectroscopy)

Parameters and applications
Particles > ~0.1µm
(max. magnification 300.000 X).
SEM is used in visualisation of crystal shape, surface morphology and structure of particles or agglomerates and the evaluation of product surface characteristics. EDX can be used to perform an elemental analysis (from Boron to Uranium) of an area of interest, e.g. in suspicion of pollution or interest in spatial composition.

Prerequisites
The substance or the object must be coated with conducting material (Au/C) to reflect electrons (sputter-coating).
The sample must be dry.

Click here to download a product sheet in PDF (709 KB)

Click here to download a product sheet in German (770 KB)

Example of SEM image

EDX map of 3 elements

Leica Stereoscan 360 (No EDX mounted on this picture)